Si3N4_0001_multislice.emd [25.5 Mb]

This file is a HRTEM multislice simulation of hexagonal silicon nitride (), with thicknesses and defocus values ranging from 2 to 50 nm. The accelerating voltage was 300 kV and the crystal is oriented along the [0001] zone axis. The 5 dimensions included are:

1. x pixel direction (0 to 1.308 nm).
2. y pixel direction (0 to 0.751 nm).
3. Si3N4 crystal thickness (2 to 50 nm in steps of 2 nm).
4. Microscope defocus (0 to 50 nm in seps of 2 nm).
5. Complex number (length of two, corresponding to real and imaginary).